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AI ART Semiconductor Wafer Testing Process in Factory Setting

by Shadow

Semiconductor Wafer Testing Process in Factory Setting

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A close-up view of a semiconductor wafer undergoing testing with a probe card connected to a tester to analyze its electrical properties and detect defects. The image captures the intricate process of testing a semiconductor wafer in a factory setting.

Image details

File type

JPEG

Size

2912×1632

Published

20:50

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