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Semiconductor Wafer Testing Process in Factory Setting
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Semiconductor Wafer Testing Process in Factory Setting

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A close-up view of a semiconductor wafer undergoing testing with a probe card connected to a tester to analyze its electrical properties and detect defects. The image captures the intricate process of testing a semiconductor wafer in a factory setting.

Image details

File type JPEG

Size 2912×1632

Published 21:50

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